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| * [[MeasurementErrorWhenSurveyingIssuePositions|Measurement error when surveying issue positions: a MultiTrait MultiError approach]]; Kim Backström, Alexandru Cernat, Rasmus Sirén, and Peter Söderlund; 2025 |
Multitrait-Multimethod Model
A Multitrait-Multimethod (MTMM) model is form of factor analysis making use of multiple measurement instruments.
Description
The model begins with a set of latent constructs, which are related to both random error and measurements.
A set of measurement instruments are employed, with the null hypothesis generally being that there is no method effect leading to differential estimation.
Reading Notes
Convergent and discriminant validation by the multitrait-multimethod matrix, Donald T. Campbell and Donald W. Fiske, 1959
Measurement error when surveying issue positions: a MultiTrait MultiError approach; Kim Backström, Alexandru Cernat, Rasmus Sirén, and Peter Söderlund; 2025